Structural evolution of nanoporous silica thin films studied by positron annihilation spectroscopy and Fourier transform infrared spectroscopy

Journal of Physics D: Applied Physics

Volumn 40, Issue 17, 2007, Pages 5266-5274

  Patel, N ^a   Mariazzi, S ^a   Toniutti, L ^a   Checchetto, R ^a   Miotello, A ^a   Dire S ^a   Brusa, R S ^a  

^a UNIVERSITY OF TRENTO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; DENSIFICATION; DEPTH PROFILING; ELECTRIC POTENTIAL; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; MICROSTRUCTURE; NANOPORES; POSITRON ANNIHILATION SPECTROSCOPY; SILICA; SPIN COATING;

FILM POROSITY; OH GROUPS; POROGEN; SOL PRECURSORS; STATIC AIR; TRANSVERSAL OPTICAL MODE;

THIN FILMS;

EID: 34548691824     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/17/038     Document Type: Article

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