Detailed analysis of gyroid structures in diblock copolymer thin films with synchrotron grazing-incidence X-ray scattering

Journal of Applied Crystallography

Volumn 40, Issue 5, 2007, Pages 950-958

  Jin, Sangwoo ^a   Yoon, Jinhwan ^a   Heo, Kyuyoung ^a   Park, Hae Woong ^a   Kim, Jehan ^a   Kim, Kwang Woo ^a   Shin, Tae Joo ^a   Chang, Taihyun ^a   Ree, Moonhor ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Diblock copolymer thin film; Grazing incidence X ray scattering; Gyroid structure; Lattice parameter; Orientation; Paracrystal lattice; Positional distortion

Indexed keywords

EID: 34548585093     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807037880     Document Type: Article

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