A comparison of modern data analysis methods for X-ray and neutron specular reflectivity data

Journal of Applied Crystallography

Volumn 40, Issue 5, 2007, Pages 820-833

  Van Der Lee, A ^a   Salah, F ^b   Harzallah, B ^b  

^a UNIVERSITÉ DE MONTPELLIER   (France)

^b FACULTÉ DES SCIENCES DE MONASTIR   (Tunisia)

Author keywords

Computer programs; Multilayers; Scattering length density; Specular reflectivity; Thin films

Indexed keywords

EID: 34548574741     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889807032207     Document Type: Article

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