Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry

Physica B: Condensed Matter

Volumn 253, Issue 3-4, 1998, Pages 254-268

  Dane, A D ^a   Veldhuis, A ^a   De Boer, D K G ^b   Leenaers, A J G ^b   Buydens, L M C ^a  

^a RADBOUD UNIVERSITY NIJMEGEN   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Genetic algorithms; GIXR; Layered materials

Indexed keywords

GENETIC ALGORITHMS; REFLECTION; THIN FILMS; X RAY ANALYSIS;

GLANCING INCIDENCE X RAY REFLECTOMETRY;

MULTILAYERS;

EID: 0032475779     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00398-6     Document Type: Article

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