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0 but recent results have indicated that it is actually the scattering from the fluctuation that needs to be small with respect to the scattering from the strongest scattering interface, which is usually the air-film or film-substrate interface
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•• The Bayesian approach to reflectivity data
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2 minimisation, and can improve matters significantly when such procedures fail. Moreover it can help in designing the optimum experiment to perform and this is demonstrated in terms of PSF analysis. This is a powerful method that can be used to address many aspects of reflectometry at both practical and theoretical levels
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2 minimisation, and can improve matters significantly when such procedures fail. Moreover it can help in designing the optimum experiment to perform and this is demonstrated in terms of PSF analysis. This is a powerful method that can be used to address many aspects of reflectometry at both practical and theoretical levels.
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••Application of genetic algorithms for characterisation of thin layered materials by glancing incidence X-ray reflectometry
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The genetic algorithm was used to obtain thicknesses and roughness for several thin film materials and was able to find an exact answer in 61% of simulated experiments in a single run. The method is capable of reducing human effort and experience and lessens the chance of missing feasible solutions. Results for experimental data were encouraging but highlighted the need for external knowledge about the system under study in order to reduce the unknown parameter ranges and hence provide more accurate solutions. This method provides a useful alternative to analytical free-form methods
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Some improvements and extensions of the application of specular neutron reflection to the study of interfaces
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Li Z.X., Thirtle P.N., Weller A., Thomas R.K., Penfold J., Webster J.R.P., Rennie A.R. Some improvements and extensions of the application of specular neutron reflection to the study of interfaces. Physica B. 248:1998;171-183.
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The structure and composition of mixed cationic and non-ionic surfactant layers adsorbed at the hydrophilic silicon surface
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3, Fe K and 6.95 keV, the latter being far away from Gd and Fe edges. This strategy enabled element-specific atomic density profiles of Gd and Fe to be obtained unambiguously. Furthermore, X-ray resonant magnetic scattering measurements showed that Gd was magnetised at room temperature. This work is an elegant demonstration of the anomalous scattering technique and shows the breadth of information that can be gained from x-ray reflectivity experiments
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3, Fe K and 6.95 keV, the latter being far away from Gd and Fe edges. This strategy enabled element-specific atomic density profiles of Gd and Fe to be obtained unambiguously. Furthermore, X-ray resonant magnetic scattering measurements showed that Gd was magnetised at room temperature. This work is an elegant demonstration of the anomalous scattering technique and shows the breadth of information that can be gained from x-ray reflectivity experiments.
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Lee, D.R.1
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0032090048
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•phase determination and inversion in specular neutron reflectometry
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The experimental feasibility of the direct inversion method is tested with two examples, a deuterated polystyrene (dPS) film using Cu, Ni and Mo magnetic reference layers and a symmetric film consisting of a dPS film between non-magnetic media of equal scattering length density. The paper demonstrates the direct inversion method to be practical with existing instrumentation for types of systems not far removed from those currently studied
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Majkrzak CF, Berk NF, Dura JA, et al. •Phase determination and inversion in specular neutron reflectometry. Physica B 1998;248:338-342.The experimental feasibility of the direct inversion method is tested with two examples, a deuterated polystyrene (dPS) film using Cu, Ni and Mo magnetic reference layers and a symmetric film consisting of a dPS film between non-magnetic media of equal scattering length density. The paper demonstrates the direct inversion method to be practical with existing instrumentation for types of systems not far removed from those currently studied.
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Physica B
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Majkrzak, C.F.1
Berk, N.F.2
Dura, J.A.3
|