Experimental feasibility of phaseless inverse scattering methods for specular reflectivity

European Physical Journal B

Volumn 13, Issue 4, 2000, Pages 755-763

  Van Der Lee, A ^a  

^a UNIVERSITÉ DE MONTPELLIER   (France)

Author keywords

61.10.Kw X ray reflectometry (surfaces, interfaces, films); 68.35.Ct Interface structure and roughness; 68.55.Jk Structure and morphology; thickness

Indexed keywords

EID: 0000292451     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510050095     Document Type: Article

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