Fitting of x-ray or neutron specular reflectivity of multilayers by Fourier analysis

Journal of Applied Physics

Volumn 80, Issue 5, 1996, Pages 2788-2790

  Li, Ming ^a   Moller M O ^a   Landwehr, G ^a  

^a UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011386082     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363196     Document Type: Article

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