Characterization of a layer stack by wavelet analysis on X-ray reflectivity data

Journal of Physics D: Applied Physics

Volumn 33, Issue 15, 2000, Pages 1757-1763

  Smigiel, E ^a   Cornet, A ^a  

^a INSA DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY MEASUREMENT (SPECIFIC GRAVITY); ROUGHNESS MEASUREMENT; THICKNESS MEASUREMENT; THIN FILMS; WAVELET TRANSFORMS; X RAY ANALYSIS;

X RAY REFLECTOMETRY;

REFLECTOMETERS;

EID: 0034247480     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/15/301     Document Type: Article

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