Genetic algorithm: Refinement of X-ray reflectivity data from multilayers and thin films

Physica B: Condensed Matter

Volumn 283, Issue 1-3, 2000, Pages 237-241

  Ulyanenkov, A ^a   Omote, K ^a   Harada, J ^a  

^a RIGAKU CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; GENETIC ALGORITHMS; MULTILAYERS; NANOSTRUCTURED MATERIALS; SUPERLATTICES; THIN FILMS; X RAY SCATTERING;

X RAY REFLECTIVITY (XRR);

X RAY ANALYSIS;

EID: 0033751220     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)01972-9     Document Type: Article

References (5)

1. Goldberg D.E. Genetic Algorithms in Search, Optimization and Machine Learning. 1989;Addison-Wesley, Reading, MA.
2. Dane A.D., Veldhuis A., de Boer D.K.G., Leenaers A.J.G., Buydens L.M.C. Physica B. 253:1998;254.
3. Harris K.D.M., Johnston R.L., Kariuki B.M. Acta Crystallogr. A 54:1998;632.
4. Carpenter S.D., Schick C.P., Weber P.M. Rev. Sci. Instr. 70:1999;2266.
5. Lee D.R., Park Y.J., Kim D., Jeong Y.H., Lee K.-B. Phys. Rev. B. 57:1998;8786.