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Volumn 17, Issue 24, 2001, Pages 7664-7669

Density profiles in thin PMMA supported films investigated by X-ray reflectometry

Author keywords

[No Author keywords available]

Indexed keywords

X RAY REFLECTOMETRY;

EID: 0035960788     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la010811w     Document Type: Article
Times cited : (79)

References (59)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.