Compositional variation of refractive index and absorption edge parameters in Hf1-xTixO2 thin films

Vacuum

Volumn 82, Issue 1, 2007, Pages 35-38

  Studenyak, I P ^a   Nahusko, O T ^a   Kranjcec M ^b,c  

^a UZHGOROD NATIONAL UNIVERSITY   (Ukraine)

^b UNIVERSITY OF ZAGREB   (Croatia)

^c RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

Amorphous materials; Optical properties; Oxides; Thin films

Indexed keywords

ABSORPTION; AMORPHOUS MATERIALS; ELLIPSOMETRY; HAFNIUM COMPOUNDS; REFRACTIVE INDEX;

DISPERSION CURVES; OPTICAL-REFRACTOMETRIC RELATION; TRANSMISSION SPECTRA;

THIN FILMS;

EID: 34548233139     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2007.03.003     Document Type: Article

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