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Journal of Non-Crystalline Solids

Volumn 353, Issue 1, 2007, Pages 31-35

Spectrometric and ellipsometric studies of (1 - x)TiO2 · xLn2O3 (Ln = Nd, Sm, Gd, Er, Yb) thin films

(3) Kranjcec, M a,b Studenyak, I P c Nahusko, O T c

a UNIVERSITY OF ZAGREB (Croatia)

b RUDER BO KOVI INSTITUTE (Croatia)

c UZHGOROD NATIONAL UNIVERSITY (Ukraine)

Author keywords

Ellipsometry; Films and coatings; Optical spectroscopy

Indexed keywords

ELLIPSOMETRY; OPTICAL COATINGS; REFRACTIVE INDEX; REFRACTOMETERS; TITANIUM DIOXIDE;

DISPERSION DEPENDENCES; FILMS AND COATINGS; OPTICAL SPECTROSCOPY;

THIN FILMS;

EID: 33845211688 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2006.09.018 Document Type: Article

Times cited : (6)

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