Influence of Hf→Zr substitution on optical and refractometric parameters of Hf1-xZrxO2 thin films

Thin Solid Films

Volumn 476, Issue 1, 2005, Pages 137-141

  Studenyak, I P ^a   Kranjcec M ^b,c   Nahusko, O T ^a   Borets, O M ^d  

^a UZHGOROD NATIONAL UNIVERSITY   (Ukraine)

^b UNIVERSITY OF ZAGREB   (Croatia)

^c RUDER BO KOVI INSTITUTE   (Croatia)

^d Institute for Information Recording Nasu   (Ukraine)

Author keywords

Amorphous materials; Ellipsometry; Optical coatings; Optical spectroscopy

Indexed keywords

AMORPHOUS MATERIALS; COMPOSITION; DISPERSIONS; ELLIPSOMETRY; ENERGY GAP; OPTICAL COATINGS; PARAMETER ESTIMATION; REFRACTIVE INDEX; SOL-GELS; SUBSTITUTION REACTIONS;

HIGH-INDEX MATERIALS; OPTICAL SPECTROSCOPY; OPTICAL-REFRACTOMETRIC SYNTHESIS; REFRACTOMETRIC PARAMETERS;

THIN FILMS;

EID: 13844255616     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.09.048     Document Type: Article

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