Parametric and threshold studies of single event sensitivity

IEEE Transactions on Nuclear Science

Volumn 54, Issue 4, 2007, Pages 1392-1405

  Petersen, Edward L ^a,b  

^a IEEE

^b NONE   (United States)

Author keywords

Figure of merit (FOM); SEU rates; Single event effect (SEE); Single event upset (SEU)

Indexed keywords

LASERS; NORMAL DISTRIBUTION; WEIBULL DISTRIBUTION;

FIGURE-OF-MERIT (FOM); SINGLE EVENT SENSITIVITY (SEE); SINGLE-EVENT UPSET (SEU);

ELECTRIC SPACE CHARGE;

EID: 34548108031     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.901201     Document Type: Conference Paper

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