Test results of single-event effects conducted by the Jet Propulsion Laboratory

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2005, Pages 36-41

  Irom, Farokh ^a   Miyahira, Tetsuo F ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Cyclotron; Heavy ion; Latchup; SEE

Indexed keywords

ANALOG SWITCHES; DELAY BUFFERS; LATCHUP; MOSFET DRIVERS; NASA;

ANALOG TO DIGITAL CONVERSION; CYCLOTRONS; DATA ACQUISITION; DIGITAL TO ANALOG CONVERSION; HEAVY IONS; MOSFET DEVICES; OSCILLATORS (ELECTRONIC); SPACECRAFT;

ELECTRONIC EQUIPMENT TESTING;

EID: 33749413701     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2005.1532662     Document Type: Conference Paper

References (7)

1. M. V. O'Bryan, et al., "Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA," 2004 IEEE Radiation Effects Data Workshop Record, pp. 10-18, 2004.
2. L. Z. Scheick, "SEE Evaluation of Digital Analog Converters for Space Applications," 2001 IEEE Radiation Effects Data Workshop Record, pp. 62-66, 2001.
3. M. V. O'Bryan, et al., "Single Event Effects Results for Candidate Spacecraft Electronics for NASA," 2003 IEEE Radiation Effects Data Workshop Record, pp. 65-76, 2003.
4. J. R. Coss, "Device Susceptibility Update 1999-2000," 2001 IEEE Radiation Effects Data Workshop Record, pp. 106-126, 2001.
5. A. H. Johnston, B. W. Hughlock, M. P. Baze and R. E. Plaag, "Effect of Temperature on Single-Particle Latchup," IEEE Trans. Nucl. Sci., Vol 38, pp. 1435-1441, Dec. 1991.
6. Steven S. McClure, private communication.
7. J. L. Wert et al., "Single Event Effects Test and Analysis Results from the Boeing Radiation Effects Laboratory (BREL)," 2005 IEEE Radiation Effects Data Workshop Record, 2005.