Effects of total dose irradiation on single-event upset hardness

IEEE Transactions on Nuclear Science

Volumn 53, Issue 4, 2006, Pages 1772-1778

  Schwank, J R ^a,b   Shaneyfelt, M R ^a,b   Felix, J A ^a,b   Dodd, P E ^a,b   Baggio, J ^a,c   Ferlet Cavrois, V ^a,c   Paillet, P ^a,c   Hash, G L ^b   Flores, R S ^b   Massengill, L W ^a,d   Blackmore, E ^a,e  

^a IEEE   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c CEA DIF   (France)

^d VANDERBILT UNIVERSITY   (United States)

^e TRIUMF   (Canada)

Author keywords

Hardness assurance; Proton irradiation; Single event upset

Indexed keywords

HARDNESS ASSURANCE; RADIATION-INDUCED CURRENTS; RADIATION-INDUCED LEAKAGE CURRENTS; SINGLE-EVENT UPSET (SEU);

ELECTRIC POTENTIAL; ELECTRIC POWER SYSTEMS; GAMMA RAYS; HARDNESS; LEAKAGE CURRENTS; RANDOM ACCESS STORAGE; THERMAL EFFECTS; X RAY ANALYSIS;

PROTON IRRADIATION;

EID: 33748345155     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.877896     Document Type: Conference Paper

References (9)

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