Positron depth profiling in solid surface layers

Annales de Chimie: Science des Materiaux

Volumn 32, Issue 4, 2007, Pages 365-382

  Grynszpan, Robert I ^a,b   Anwand, Wolfgang ^c   Brauer, Gerhard ^c   Coleman, Paul G ^d  

^a DGA ^*

^b CNRS ISCSA Thiais   (France)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^d University of Bath   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; ION IMPLANTATION; MULTILAYERS; PHASE TRANSITIONS; POSITRON ANNIHILATION;

METAL COATINGS; SLOW POSITRON IMPLANTATION SPECTROSCOPY (SPIS); SOLID SURFACE;

DEPTH PROFILING;

EID: 34548039685     PISSN: 01519107     EISSN: None     Source Type: Journal    
DOI: 10.3166/acsm.32.365-382     Document Type: Review

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