|
Volumn 81, Issue 1, 2005, Pages 209-215
|
DC magnetron sputtered tungsten: W film properties and electrical properties of W/Si Schottky diodes
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL DEFECTS;
ELECTRIC CURRENTS;
ELECTRIC PROPERTIES;
FERMI LEVEL;
GRAIN SIZE AND SHAPE;
KINETIC ENERGY;
LATTICE CONSTANTS;
MAGNETRON SPUTTERING;
METALLIC FILMS;
PHASE TRANSITIONS;
SCHOTTKY BARRIER DIODES;
SILICON;
SPUTTER DEPOSITION;
THIN FILMS;
GAS PRESSURE;
MAGNETRON SPUTTERED TUNGSTEN;
STRESS TRANSITIONS;
THIN FILM DEPOSITION;
TUNGSTEN;
|
EID: 18144431038
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s00339-004-2558-5 Document Type: Article |
Times cited : (22)
|
References (25)
|