Slow positron implantation spectroscopy of insulators: Charging effects

Materials Science Forum

Volumn 255-257, Issue , 1997, Pages 668-670

  Coleman, P G ^a   Kuna, S ^a   Grynszpan, R ^b,c  

^a UNIVERSITY OF EAST ANGLIA   (United Kingdom)

^b CNRS   (France)

^c CEB DPN   (France)

Author keywords

Charging Effects; Insulators; Polymers; Positron Beams

Indexed keywords

CHARGED PARTICLES; CRYSTAL STRUCTURE; FILM PREPARATION; ION BOMBARDMENT; SPECTROSCOPIC ANALYSIS;

SLOW POSITRON IMPLANTATION SPECTROSCOPY (SPIS);

PLASTIC FILMS;

EID: 0031357451     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.255-257.668     Document Type: Article

References (3)

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3. N.B. Chilton and P.G. Coleman, Meas.Sci. Technol. 6, 53 (1995)