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Volumn 81, Issue 11-12, 2007, Pages 1524-1528

Morphology and composition of GaN films grown by cyclic-pulsed laser deposition

Author keywords

EDS; GaN; PLD; XPS

Indexed keywords

COALESCENCE; ENERGY DISPERSIVE SPECTROSCOPY; FILM GROWTH; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

CYCLIC-PULSED LASER DEPOSITION; XPS COMPOSITION ANALYSES;

GALLIUM NITRIDE;

EID: 34547941837 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/j.vacuum.2007.04.018 Document Type: Article

Times cited : (9)

References (15)

1
- 0033309549
- Mukai T., Yamada M., and Nakamura S. Jpn J Appl Phys 38 (1999) 3976
- (1999) Jpn J Appl Phys , vol.38 , pp. 3976
- Mukai, T.¹ Yamada, M.² Nakamura, S.³

2
- 34547956714
- Krames M.R., Ochiai-Holcomb M., Höfler G.E., Carter-Coman C., Chen E I., Tan I.-H., et al. Appl Phys Lett 75 (1999) 2635
- (1999) Appl Phys Lett , vol.75 , pp. 2635
- Krames, M.R.¹ Ochiai-Holcomb, M.² Höfler, G.E.³ Carter-Coman, C.⁴ Chen E, I.⁵ Tan, I.-H.⁶

3
- 0030572215
- Akasaki I., Sota S., Sakai H., Tanaka T., Koike M., and Amano H. Electron Lett 32 (1996) 1105
- (1996) Electron Lett , vol.32 , pp. 1105
- Akasaki, I.¹ Sota, S.² Sakai, H.³ Tanaka, T.⁴ Koike, M.⁵ Amano, H.⁶

4
- 0042229788
- Nakamura S., Senoh M., Nagahama S.-I., Iwasa N., Matsushita T., and Mukai T. Appl Phys Lett 76 (2000) 22
- (2000) Appl Phys Lett , vol.76 , pp. 22
- Nakamura, S.¹ Senoh, M.² Nagahama, S.-I.³ Iwasa, N.⁴ Matsushita, T.⁵ Mukai, T.⁶

5
- 0036377223
- Sanguino P., Koynov S., Niehus M., Melo L.V., Schwarz R., Alves H., et al. Mat Res Soc Symp Proc 693 (2002) 81
- (2002) Mat Res Soc Symp Proc , vol.693 , pp. 81
- Sanguino, P.¹ Koynov, S.² Niehus, M.³ Melo, L.V.⁴ Schwarz, R.⁵ Alves, H.⁶

6
- 0000705035
- Bour D.P., Nickel N.M., Van de Walle C.G., Kneissl M.S., Krusor B.S., Ping Mei, et al. Appl Phys Lett 76 (2000) 2182
- (2000) Appl Phys Lett , vol.76 , pp. 2182
- Bour, D.P.¹ Nickel, N.M.² Van de Walle, C.G.³ Kneissl, M.S.⁴ Krusor, B.S.⁵ Ping Mei⁶

7
- 0036454327
- Sanguino P., Niehus M., Koynov S., Schwarz R., Alves H., and Meyer B.K. Mat Res Soc Symp Proc 722 (2002) 181
- (2002) Mat Res Soc Symp Proc , vol.722 , pp. 181
- Sanguino, P.¹ Niehus, M.² Koynov, S.³ Schwarz, R.⁴ Alves, H.⁵ Meyer, B.K.⁶

8
- 0037343556
- Sanguino P., Niehus M., Melo L.V., Schwarz R., Koynov S., Monteiro T., et al. Solid-State Electronics 47 (2003) 559
- (2003) Solid-State Electronics , vol.47 , pp. 559
- Sanguino, P.¹ Niehus, M.² Melo, L.V.³ Schwarz, R.⁴ Koynov, S.⁵ Monteiro, T.⁶

9
- 0342501959
- Fernández F.E., Rodrígez E., Pumarol M., Guzmán T., Jia W., and Martínez A. Thin Solid Films 377-378 (2000) 781
- (2000) Thin Solid Films , vol.377-378 , pp. 781
- Fernández, F.E.¹ Rodrígez, E.² Pumarol, M.³ Guzmán, T.⁴ Jia, W.⁵ Martínez, A.⁶

10
- 0035933183
- Deiss J.L., Hirlimann C.H., Loison J.L., Robino M., and Versini G. Mat Sci Eng B 82 (2001) 68
- (2001) Mat Sci Eng B , vol.82 , pp. 68
- Deiss, J.L.¹ Hirlimann, C.H.² Loison, J.L.³ Robino, M.⁴ Versini, G.⁵

11
- 0031546402
- Feiler D., Stanley Williams R., Alec Talin A., Yoon H., and Goorsky M.S. J Cryst Growth 171 (1997) 12
- (1997) J Cryst Growth , vol.171 , pp. 12
- Feiler, D.¹ Stanley Williams, R.² Alec Talin, A.³ Yoon, H.⁴ Goorsky, M.S.⁵

13
- 0003521686
- Springer, Berlin
- Reimer L. Scanning Electron Microscopy. second ed (1998), Springer, Berlin
- (1998) Scanning Electron Microscopy. second ed
- Reimer, L.¹

14
- 21744452034
- Sanguino P., Teodoro O.M.N.D., Niehus M., Marques C.P., Moutinho A.M.C., Alves E., et al. Sensors and Actuators A 121 (2005) 131
- (2005) Sensors and Actuators A , vol.121 , pp. 131
- Sanguino, P.¹ Teodoro, O.M.N.D.² Niehus, M.³ Marques, C.P.⁴ Moutinho, A.M.C.⁵ Alves, E.⁶

15
- 0035302233
- Ishihara M., Yakamoto K., Kokai F., and Koga Y. Jpn J Appl Phys 40 (2001) 2413
- (2001) Jpn J Appl Phys , vol.40 , pp. 2413
- Ishihara, M.¹ Yakamoto, K.² Kokai, F.³ Koga, Y.⁴

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