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Journal of Applied Physics

Volumn 102, Issue 2, 2007, Pages

Accurate experimental determination of the Poisson's ratio of GaN using high-resolution x-ray diffraction

(3) Moram, M A a Barber, Z H a Humphreys, C J a

a UNIVERSITY OF CAMBRIDGE (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); METALLIC FILMS; POISSON RATIO; THIN FILMS; VAPOR PHASE EPITAXY; X RAY DIFFRACTION;

-RAY DIFFRACTION LATTICE; STRAIN-RELIEVING EDGE;

GALLIUM NITRIDE;

EID: 34547577152 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2749484 Document Type: Article

Times cited : (92)

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