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Volumn 226-228, Issue 1, 2004, Pages 79-89
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Anisotropy of the elastic properties of wurtzite InN epitaxial films
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Author keywords
Elastic Anisotropy; Point Defects; Strain; Wurtzite Nitrides; X Ray Diffraction
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Indexed keywords
ANISOTROPY;
CONCENTRATION (PROCESS);
ELASTIC MODULI;
POINT DEFECTS;
POISSON RATIO;
SECONDARY ION MASS SPECTROMETRY;
SEMICONDUCTING INDIUM COMPOUNDS;
STRAIN;
X RAY DIFFRACTION;
ELASTIC ANISOTROPY;
ELASTIC PROPERTIES;
EPITAXIAL FILMS;
WURTZITE NITRIDES;
SEMICONDUCTING FILMS;
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EID: 2942666144
PISSN: 10120386
EISSN: 16629507
Source Type: Journal
DOI: 10.4028/www.scientific.net/ddf.226-228.79 Document Type: Article |
Times cited : (10)
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References (34)
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