메뉴 건너뛰기




Volumn 11, Issue 1, 2007, Pages 1-16

Reliability aspects of electronics packaging technology using anisotropic conductive adhesives

Author keywords

Anisotropic conductive adhesives; Electronics packaging; Reliability

Indexed keywords


EID: 34547361181     PISSN: 10076417     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11741-007-0101-6     Document Type: Article
Times cited : (14)

References (27)
  • 3
    • 0001486781 scopus 로고
    • A solder alloy filled Z-axis conductive epoxy adhesive[J]
    • Savolainen P, Kivilahti J. A solder alloy filled Z-axis conductive epoxy adhesive[J]. Journal of Adhesion, 1995, 49(3-4): 187-196.
    • (1995) Journal of Adhesion , vol.49 , Issue.3-4 , pp. 187-196
    • Savolainen, P.1    Kivilahti, J.2
  • 5
    • 0042371331 scopus 로고    scopus 로고
    • Reliability of anisotropically conductive adhesive joints on a flip-chip/FR4 substrate[J]
    • Liu J, Lai Z. Reliability of anisotropically conductive adhesive joints on a flip-chip/FR4 substrate[J]. Journal of Electronic Packaging, 2002, 124(3): 240-245.
    • (2002) Journal of Electronic Packaging , vol.124 , Issue.3 , pp. 240-245
    • Liu, J.1    Lai, Z.2
  • 6
    • 0030212322 scopus 로고    scopus 로고
    • Anisotropically conductive adhesive flip-chip bonding on rigid and flexible printed circuit substrates[J]
    • Lai Z, Liu J. Anisotropically conductive adhesive flip-chip bonding on rigid and flexible printed circuit substrates[J]. IEEE Transactions on Components Packaging and Manufacturing Technology Part B, 1996, 19(3): 644-660.
    • (1996) IEEE Transactions on Components Packaging and Manufacturing Technology Part B , vol.19 , Issue.3 , pp. 644-660
    • Lai, Z.1    Liu, J.2
  • 8
    • 0036681696 scopus 로고    scopus 로고
    • Effects of bonding parameters on the reliability performance of anisotropic conductive adhesive interconnects for flip-chip-on-flex packages assembly I. Different bonding temperature[J]
    • Chan Y C, Luk D Y. Effects of bonding parameters on the reliability performance of anisotropic conductive adhesive interconnects for flip-chip-on-flex packages assembly I. Different bonding temperature[J]. Microelectronics Reliability, 2002, 42: 1185-1194.
    • (2002) Microelectronics Reliability , vol.42 , pp. 1185-1194
    • Chan, Y.C.1    Luk, D.Y.2
  • 9
    • 1142263930 scopus 로고    scopus 로고
    • Thermal stability performance of anisotropic conductive film at different bonding temperatures[J]
    • Tan S C, Chan Y C, Chin Y W, Tan C W. Thermal stability performance of anisotropic conductive film at different bonding temperatures[J]. Microelectronics Reliability, 2004, 44: 495-503.
    • (2004) Microelectronics Reliability , vol.44 , pp. 495-503
    • Tan, S.C.1    Chan, Y.C.2    Chin, Y.W.3    Tan, C.W.4
  • 10
    • 0037381421 scopus 로고    scopus 로고
    • The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications[J]
    • Yin C Y, Alam M O, Chan Y C, Bailey C, Lu H. The effect of reflow process on the contact resistance and reliability of anisotropic conductive film interconnection for flip chip on flex applications[J]. Microelectronics Reliability, 2003, 43(4): 625-633.
    • (2003) Microelectronics Reliability , vol.43 , Issue.4 , pp. 625-633
    • Yin, C.Y.1    Alam, M.O.2    Chan, Y.C.3    Bailey, C.4    Lu, H.5
  • 11
    • 1542610631 scopus 로고    scopus 로고
    • Study of adhesive flip chip bonding process and failure mechanisms of ACA joints[J]
    • Seppälä A, Ristolainen E. Study of adhesive flip chip bonding process and failure mechanisms of ACA joints[J]. Microelectronics Reliability, 2004, 44(4): 639-648.
    • (2004) Microelectronics Reliability , vol.44 , Issue.4 , pp. 639-648
    • Seppälä, A.1    Ristolainen, E.2
  • 12
    • 0033346736 scopus 로고    scopus 로고
    • A reliable and environmentally friendly packaging technology-flip-chip joining using anisotropically conductive adhesive[J]
    • Liu J, Tolvgard A, Malmodin J, Lai Z. A reliable and environmentally friendly packaging technology-flip-chip joining using anisotropically conductive adhesive[J]. IEEE Transactions on Components and Packaging Technologies, 1999, 22(2): 186-190.
    • (1999) IEEE Transactions on Components and Packaging Technologies , vol.22 , Issue.2 , pp. 186-190
    • Liu, J.1    Tolvgard, A.2    Malmodin, J.3    Lai, Z.4
  • 13
    • 0032274513 scopus 로고    scopus 로고
    • Effect of bump height on the reliability of ACA flip chip joining with FR4 rigid and polyimide flexible substrate[J]
    • Lai Zong-he, Lai Ruo-yin, Persson K, Liu J. Effect of bump height on the reliability of ACA flip chip joining with FR4 rigid and polyimide flexible substrate[J]. Journal of Electronics Manufacturing, 1998, 8(3-4): 217-224.
    • (1998) Journal of Electronics Manufacturing , vol.8 , Issue.3-4 , pp. 217-224
    • Zong-he, L.1    Ruo-yin, L.2    Persson, K.3    Liu, J.4
  • 14
    • 0030191725 scopus 로고    scopus 로고
    • Moisture sorption in some popular conductive adhesives[J]
    • Khoo C G L, Liu J. Moisture sorption in some popular conductive adhesives[J]. Circuit World, 1996, 22(4): 9-15.
    • (1996) Circuit World , vol.22 , Issue.4 , pp. 9-15
    • Khoo, C.G.L.1    Liu, J.2
  • 15
    • 0030288469 scopus 로고    scopus 로고
    • On the failure mechanism of anisotropically conductive adhesive joints on copper metallisation[J]
    • Liu J. On the failure mechanism of anisotropically conductive adhesive joints on copper metallisation[J]. International Journal of Adhesion and Adhesives, 1996, 16(4): 285-287.
    • (1996) International Journal of Adhesion and Adhesives , vol.16 , Issue.4 , pp. 285-287
    • Liu, J.1
  • 17
    • 0031213109 scopus 로고    scopus 로고
    • Some optimum processing properties for anisotropic conductive adhesives for flip chip interconnection[J]
    • Mannan S H, Williams D J, Whalley D C. Some optimum processing properties for anisotropic conductive adhesives for flip chip interconnection[J]. Journal of Materials Science-Materials in Electronics, 1997, 8(4): 223-231.
    • (1997) Journal of Materials Science-Materials in Electronics , vol.8 , Issue.4 , pp. 223-231
    • Mannan, S.H.1    Williams, D.J.2    Whalley, D.C.3
  • 18
    • 34547372016 scopus 로고    scopus 로고
    • Mannan S H, Williams D J, Whalley D G, Ogunjimi A 0. Models to determine guidelines for the anisotropic conducting adhesives joining process[C]// Liu J, ed. Conductive Adhesives for Electronics Packaging, Port Erin, Isle of Man, UK: Electrochemical Publications Ltd, 1999, 78-98.
    • Mannan S H, Williams D J, Whalley D G, Ogunjimi A 0. Models to determine guidelines for the anisotropic conducting adhesives joining process[C]// Liu J, ed. Conductive Adhesives for Electronics Packaging, Port Erin, Isle of Man, UK: Electrochemical Publications Ltd, 1999, 78-98.
  • 22
    • 0030212322 scopus 로고    scopus 로고
    • Anisotropically conductive adhesive flip-chip bonding on rigid and flexible printed circuit substrates[J]
    • Lai Z, Liu J. Anisotropically conductive adhesive flip-chip bonding on rigid and flexible printed circuit substrates[J]. IEEE Transactions on CPMT, Part B: Advanced Packaging, 1996, 19(3): 644-660.
    • (1996) IEEE Transactions on CPMT, Part B: Advanced Packaging , vol.19 , Issue.3 , pp. 644-660
    • Lai, Z.1    Liu, J.2
  • 23
    • 0026118394 scopus 로고    scopus 로고
    • Joyce C F. A Weibull model to characterize lifetimes of aluminum alloy electrical wire connections[J]. IEEE Transactions on CPMT, 1991, 14(1): 124-133.
    • Joyce C F. A Weibull model to characterize lifetimes of aluminum alloy electrical wire connections[J]. IEEE Transactions on CPMT, 1991, 14(1): 124-133.
  • 24
    • 0033311123 scopus 로고    scopus 로고
    • Solder joint reliability of high I/O ceramic-ball-grid arrays and ceramic quadflat-packs in computer environments: The PowerPC 603 (TM) and PowerPC 604 (TM) microprocessors[J]
    • Gerke R D, Kromann G B. Solder joint reliability of high I/O ceramic-ball-grid arrays and ceramic quadflat-packs in computer environments: The PowerPC 603 (TM) and PowerPC 604 (TM) microprocessors[J]. Solder Joint Reliability of High I/O Ceramic-Ball, 1999, 22(4): 488-496.
    • (1999) Solder Joint Reliability of High I/O Ceramic-Ball , vol.22 , Issue.4 , pp. 488-496
    • Gerke, R.D.1    Kromann, G.B.2
  • 26
    • 0030242035 scopus 로고    scopus 로고
    • Effect of silicone vapor and humidity on contact reliability of micro relay contacts[J]
    • Tamai T. Effect of silicone vapor and humidity on contact reliability of micro relay contacts[J]. IEEE Transactions on CPMT, Part A: Packaging Technologies, 1996, 19(3): 329-338.
    • (1996) IEEE Transactions on CPMT, Part A: Packaging Technologies , vol.19 , Issue.3 , pp. 329-338
    • Tamai, T.1
  • 27
    • 84987266075 scopus 로고
    • A statistical distribution function of wide applicability[J]
    • Weibull W. A statistical distribution function of wide applicability[J]. Journal of Applied Mechanics, 1951, 18(3): 293-296.
    • (1951) Journal of Applied Mechanics , vol.18 , Issue.3 , pp. 293-296
    • Weibull, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.