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Volumn 8, Issue 3, 1998, Pages 217-224

Effect of bump height on the reliability of ACA flip chip joining with FR4 rigid and polyimide flexible substrate

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVES; CONDUCTIVE MATERIALS; ELECTRONICS PACKAGING;

EID: 0032274513     PISSN: 09603131     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0960313198000203     Document Type: Article
Times cited : (22)

References (8)
  • 1
    • 0029406993 scopus 로고
    • An overview of advances of conductive adhesive joining technology in electronics applications
    • J. Liu, "An overview of advances of conductive adhesive joining technology in electronics applications", Materials Technology 10 (1995), 247-252.
    • (1995) Materials Technology , vol.10 , pp. 247-252
    • Liu, J.1
  • 2
    • 0037607752 scopus 로고    scopus 로고
    • Anisotropic conductive adhesive films for flip chip interconnection
    • ed. Johan Liu, Electrochemical Publications Ltd., UK
    • I. Watanabe and K. Takemura, "Anisotropic conductive adhesive films for flip chip interconnection", in Conductive Adhesives for Electronics Packaging, ed. Johan Liu, Electrochemical Publications Ltd., UK, 1998.
    • (1998) Conductive Adhesives for Electronics Packaging
    • Watanabe, I.1    Takemura, K.2
  • 4
    • 0347580635 scopus 로고    scopus 로고
    • Effect of gap height on conduction within anisotropic conducting adhesive assemblies
    • S. H. Mannan, C. N. Oguibe, D. C. Whalley and D. J. Williams, "Effect of gap height on conduction within anisotropic conducting adhesive assemblies", J. Elect. Manuf. 7(3) (1997), 211-224.
    • (1997) J. Elect. Manuf. , vol.7 , Issue.3 , pp. 211-224
    • Mannan, S.H.1    Oguibe, C.N.2    Whalley, D.C.3    Williams, D.J.4
  • 5
    • 1242306529 scopus 로고    scopus 로고
    • A study on the electrical conduction mechanism of anisotropically conductive film (ACF) for LCD packaging applications
    • M. J. Yim, K. W. Paik, Y. K. Kim and H. N. Hwang, "A study on the electrical conduction mechanism of anisotropically conductive film (ACF) for LCD packaging applications", EEP Advances in Electronic Packaging, 19-1 (1997), 65-72.
    • (1997) EEP Advances in Electronic Packaging , vol.19 , Issue.1 , pp. 65-72
    • Yim, M.J.1    Paik, K.W.2    Kim, Y.K.3    Hwang, H.N.4
  • 6
    • 5844398851 scopus 로고    scopus 로고
    • Package reliability
    • ed. R. R. Tummala, E. J. Rymaszewski and A. G. Klopfenstein, Chapman & Hall, New York
    • L. S. Goldmann, R. T. Howard and D. A. Jeannotte, "Package reliability", in Microelectronics Packaging Handbook, ed. R. R. Tummala, E. J. Rymaszewski and A. G. Klopfenstein, Chapman & Hall, New York, 1997, pp. 1-404.
    • (1997) Microelectronics Packaging Handbook , pp. 1-404
    • Goldmann, L.S.1    Howard, R.T.2    Jeannotte, D.A.3
  • 7
    • 0003498148 scopus 로고
    • A prediction of the thermal fatigue life of solder joints using crack propagation rate and equivalent strain range
    • ed. John H. Lau, Van Nostrand Reinhold, New York
    • R. Satoh, "A prediction of the thermal fatigue life of solder joints using crack propagation rate and equivalent strain range", in Thermal Stress and Strain in Microelectronics Packaging, ed. John H. Lau, Van Nostrand Reinhold, New York, 1993, pp. 500-531.
    • (1993) Thermal Stress and Strain in Microelectronics Packaging , pp. 500-531
    • Satoh, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.