Effect of thermal strain on structure and polarization fatigue of CSD-derived PbZr0.53Ti0.47O3/LaNiO3 hetero-structures

Applied Physics A: Materials Science and Processing

Volumn 88, Issue 4, 2007, Pages 657-660

  Wang, G S ^a,b   Remiens D ^b   Dogheche, E ^b   Dong, X L ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

^b INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; DEPOSITION; MAGNESIA; POLARIZATION; SEMICONDUCTING LEAD COMPOUNDS; X RAY DIFFRACTION;

POLARIZATION FATIGUE; THERMAL STRAIN; THERMAL STRUCTURES;

HETEROJUNCTIONS;

EID: 34547317239     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-4022-9     Document Type: Article

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