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Volumn 284, Issue 1-2, 2005, Pages 184-189

The effect of LaNiO3 bottom electrode thickness on ferroelectric and dielectric properties of (1 0 0) oriented PbZr 0.53Ti0.47O3 films

Author keywords

A1. X ray diffraction; B1. Perovskite; B2. Ferroelectric materials

Indexed keywords

DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; ELECTRODES; FERROELECTRIC MATERIALS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PERMITTIVITY; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SOL-GELS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 25144508207     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2005.07.014     Document Type: Article
Times cited : (20)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.