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Volumn 284, Issue 1-2, 2005, Pages 184-189
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The effect of LaNiO3 bottom electrode thickness on ferroelectric and dielectric properties of (1 0 0) oriented PbZr 0.53Ti0.47O3 films
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Author keywords
A1. X ray diffraction; B1. Perovskite; B2. Ferroelectric materials
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Indexed keywords
DIELECTRIC LOSSES;
DIELECTRIC PROPERTIES;
ELECTRODES;
FERROELECTRIC MATERIALS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
PERMITTIVITY;
PEROVSKITE;
SCANNING ELECTRON MICROSCOPY;
SOL-GELS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
COLUMNAR STRUCTURES;
LNO FILMS;
LANTHANUM COMPOUNDS;
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EID: 25144508207
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2005.07.014 Document Type: Article |
Times cited : (20)
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References (18)
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