Detection of residual stresses in Pb(Zr0.53Ti 0.47)O3 thin films prepared on LaNiO3 buffered metal substrates with Raman spectroscopy

Applied Physics Letters

Volumn 88, Issue 15, 2006, Pages

  Cheng, Jinrong ^a   He, Liang ^a   Yu, Shengwen ^a   Meng, Zhongyan ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

LANTHANUM COMPOUNDS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; RESIDUAL STRESSES; SOL-GELS; STAINLESS STEEL; TITANIUM OXIDES;

RAMAN MODES; RAMAN SHIFTS; THERMAL STRESSES;

THIN FILMS;

EID: 33646121259     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2194869     Document Type: Article

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