Fault diagnosis in designs with convolutional compactors

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 498-507

  Mrugalski, Grzegorz ^a   Pogiel, Artur ^b   Rajski, Janusz ^a   Tyszer, Jerzy ^b   Wang, Chen ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

^b POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; DESIGN FOR TESTABILITY; ERROR ANALYSIS; FAILURE ANALYSIS; FUNCTIONS; SILICON; VLSI CIRCUITS;

MULTI-SITE TESTING METHODS; SCAN-BASED DESIGNS; TEST PATTERNS; TEST-RESPONSE COMPACTION;

BUILT-IN SELF TEST;

EID: 18144370070     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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