Computation of accurate interconnect process parameter values for performance corners under process variations

Proceedings - Design Automation Conference

Volumn , Issue , 2006, Pages 797-800

  Huebbers, Frank ^a   Dasdan, Ali ^b   Ismail, Yehea ^a  

^a NORTHWESTERN UNIVERSITY   (United States)

^b YAHOO INC   (United States)

Author keywords

Delay; Interconnect; Sorners; STA; Variations

Indexed keywords

CIRCUIT SIMULATION; ERROR CORRECTION; MATHEMATICAL MODELS; PARAMETER ESTIMATION;

INTERCONNECT PARAMETERS; PROCESS VARIATIONS; SORNERS;

INTERCONNECTION NETWORKS;

EID: 34547155744     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1146909.1147110     Document Type: Conference Paper

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