Magnetic imaging with scanning probe microscopy

Nanotechnology

Volumn 15, Issue 10, 2004, Pages

  Sueoka, Kazuhisa ^a   Subagyo, Agus ^a   Hosoi, Hirotaka ^b   Mukasa, Koichi ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROELECTRIC MATERIALS; ATOMIC FORCE MICROSCOPY; COATING TECHNIQUES; ELECTRONIC STRUCTURE; FERMI LEVEL; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SPIN COATING;

BANDGAP ENERGY; MAGNETIC IMAGING; SCANNING PROBE MICROSCOPY; SPATIAL RESOLUTION;

IMAGE ANALYSIS;

EID: 7244239004     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/15/10/031     Document Type: Conference Paper

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