The effect of the shape of a tip's apex on the fabrication of an AFM tip with an attached single carbon nanotube

Sensors and Actuators, A: Physical

Volumn 125, Issue 1, 2005, Pages 41-49

  Lee, Hyung Woo ^a,b   Kim, Soo Hyun ^a   Kwak, Yoon Keun ^a   Lee, Eung Sug ^b   Han, Chang Soo ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Korea Institute of Machine and Materials   (South Korea)

Author keywords

Atomic force microscope (AFM); Blunt tip; Dielectrophoresis; Multi walled carbon nanotubes

Indexed keywords

ATOMIC FORCE MICROSCOPES (AFM); BLUNT TIP; DIELECTROPHORESIS; MULTI-WALLED CARBON NANOTUBES (MWNT);

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; ELECTRODES; ELECTROPHORESIS;

MICROSCOPES;

EID: 26844541621     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2005.05.020     Document Type: Article

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