Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stress

Journal of the Electrochemical Society

Volumn 154, Issue 7, 2007, Pages

  Tai, Ya Hsiang ^a   Huang, Shih Che ^a   Lin, Chien Wen ^a   Chiu, Hao Lin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; POLYSILICON; TRANSIENT ANALYSIS;

DC STRESS; HOT CARRIER STRESS; SELF-HEATING EFFECT;

THIN FILM TRANSISTORS;

EID: 34249899101     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2735921     Document Type: Article

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