Degradation of capacitance-voltage characteristics induced by self-heating effect in poly-Si TFTs

Electrochemical and Solid-State Letters

Volumn 9, Issue 6, 2006, Pages

  Tai, Ya Hsiang ^a   Huang, Shih Che ^a   Chiu, Hao Lin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; DEGRADATION; ELECTRIC POTENTIAL; SILICON;

CAPACITANCE-VOLTAGE CHARACTERISTICS; FLAT BAND VOLTAGE; GATE VOLTAGE; SELF HEATING STRESS;

THIN FILM TRANSISTORS;

EID: 33645717030     PISSN: 10990062     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2191007     Document Type: Article

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