Correlation of crystalline and structural properties of C60 thin films grown at various temperature with charge carrier mobility

Applied Physics Letters

Volumn 90, Issue 21, 2007, Pages

  Singh, Th B ^a   Sariciftci, N S ^a   Yang, H ^b   Yang, L ^c   Plochberger, B ^a   Sitter, H ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIER MOBILITY; CRYSTALLINE QUALITY; FULLERENE CRYSTALS;

CARRIER MOBILITY; ELECTRIC CHARGE; FULLERENES; SINGLE CRYSTALS; SUBSTRATES; TRANSISTORS;

THIN FILMS;

EID: 34249670265     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2743386     Document Type: Article

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