Influence of the surface charge on the operation of ballistic T-branch junctions: A self-consistent model for Monte Carlo simulations

Semiconductor Science and Technology

Volumn 22, Issue 6, 2007, Pages 663-670

  Iiguez De La Torre I ^a   Mateos, J ^a   Gonzalez T ^a   Pardo, D ^a   Galloo, J S ^b   Bollaert, S ^b   Roelens, Y ^b   Cappy, A ^b  

^a UNIVERSITY OF SALAMANCA   (Spain)

^b INSTITUT D ELECTRONIQUE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; MATHEMATICAL MODELS; MONTE CARLO METHODS; SIMULATORS; SURFACE CHARGE; TWO DIMENSIONAL;

CENTRAL BRANCH POTENTIAL; MONTE CARLO SIMULATORS; REAL DEVICES;

SEMICONDUCTOR JUNCTIONS;

EID: 34249664356     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/22/6/014     Document Type: Article

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