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Volumn , Issue , 2004, Pages 378-381

Transition from ballistic to ohmic transport in T-Branch Junctions at room temperature in GaInAs/AlInAs heterostructures

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA PROCESSING; ELECTRON BEAMS; MONTE CARLO METHODS; OHMIC CONTACTS; REACTIVE ION ETCHING; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 23744462087     PISSN: 10928669     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (15)

References (4)
  • 2
    • 0035794337 scopus 로고    scopus 로고
    • Electrical properties of three-terminal ballistic junctions
    • 2 april
    • H.Q. Xu, "Electrical properties of three-terminal ballistic junctions", Applied Physics Letters, V.78,N°14 (2 april 2001)
    • (2001) Applied Physics Letters , vol.78 , Issue.14
    • Xu, H.Q.1
  • 3
    • 0036492866 scopus 로고    scopus 로고
    • A novel electrical property of three-terminal ballistic junctions and its applications in nanoelectronics
    • H.Q. Xu, "A novel electrical property of three-terminal ballistic junctions and its applications in nanoelectronics", Physica E, 13 (2002) 942-945
    • (2002) Physica E , vol.13 , pp. 942-945
    • Xu, H.Q.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.