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Volumn 527-529, Issue PART 1, 2006, Pages 509-512

Deep traps in high-purity semi-insulating 6H-SiC substrates: Thermally stimulated current spectroscopy

Author keywords

Deep traps; High purity semi insulating SiC; Thermally stimulated current spectroscopy

Indexed keywords

ACTIVATION ENERGY; ELECTRON TRAPS; ENERGY GAP; HOLE TRAPS; LIGHTING;

EID: 34249051665     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-425-1.509     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 11
    • 2442696901 scopus 로고    scopus 로고
    • Z-Q, Fang, D.C. Look, R. Chandrasekaran, S. Rao, and S.E. Saddow: J. Electron. Mater. 33 (2004), p. 456 and unpublished results after electron-irradiation.
    • Z-Q, Fang, D.C. Look, R. Chandrasekaran, S. Rao, and S.E. Saddow: J. Electron. Mater. 33 (2004), p. 456 and unpublished results after electron-irradiation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.