Precise determination of deep trap signatures and their relative and absolute concentrations in semi-insulatina GaAs

Journal of Applied Physics

Volumn 84, Issue 4, 1998, Pages 2018-2024

  Pavlovic M ^a   Desnica, U V ^a  

^a RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000159451     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368258     Document Type: Article

References (44)

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