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TMS Annual Meeting

Volumn 2006, Issue , 2006, Pages 77-86

Atom probe tomography characterization of a gas atomized metallic glass

(5) Miller, Michael a Venkataraman, Shankar b Eckert, Jürgen b,c Schultz, Ludwig c Sordelet, Daniel d,e

a OAK RIDGE NATIONAL LABORATORY (United States)

b DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

c IFW DRESDEN (Germany)

d IOWA STATE UNIVERSITY (United States)

e Iowa State University (United States)

Author keywords

Atom probe tomography; Metallic glasses; Rapid solidification

Indexed keywords

ANNEALING; ATOMIZERS; CRYSTALLIZATION; ELECTRODES; GLASS TRANSITION; MICROSTRUCTURE; RAPID SOLIDIFICATION; TOMOGRAPHY;

ATOM PROBE TOMOGRAPHY; CRYSTALLIZATION TEMPERATURE; MULTIPHASE MICROSTRUCTURE; POWDER PARTICLES;

METALLIC GLASS;

EID: 33845935276 PISSN: None EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.