Advantages of the local electrode for atom probe tomography applications

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1722-1723

  Ulfig, R ^a   Larson, D J ^a   Kelly, T F ^a  

^a Imago Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750878219     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927606061113     Document Type: Conference Paper

References (4)

1. T.F. Kelly et. al., Microscopy and Microanalysis 10 (2004)
2. O. Nishikawa and M. Kimoto, Appl. Surf. Sci. 76/77 (1994)
3. T. F. Kelly, P.P. Camus, D.J. Larson, L.M. Olzmann, and S.S. Bajikar, Ultramicroscopy (1995)
4. M.K. Miller, G.D.W. Smith, Atom Probe Microanalysis, MRS materials Research (1989)