Nanoscale determination of surface orientation and electrostatic properties of ZnO thin films

Applied Physics A: Materials Science and Processing

Volumn 88, Issue 1, 2007, Pages 77-82

  Zuniga Perez J ^a   Palacios Lidon E ^b   Munoz Sanjose V ^a   Colchero, J ^b  

^a UNIVERSITY OF VALENCIA   (Spain)

^b UNIVERSITY OF MURCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; DATA REDUCTION; ELECTROSTATICS; ZINC OXIDE;

IONIC TERMINATION; KELVIN PROBE MICROSCOPY; NANOGONIOMETRY; SURFACE ORIENTATION;

THIN FILMS;

EID: 34248545200     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-3944-6     Document Type: Article

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