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Volumn 25, Issue 8, 2000, Pages 58-65

Characterization of transparent conducting oxides

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CARRIER CONCENTRATION; CHEMICAL OPERATIONS; CONDUCTIVE MATERIALS; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; INFRARED SPECTROSCOPY; OPTICAL PROPERTIES; OPTICAL VARIABLES MEASUREMENT; RESEARCH AND DEVELOPMENT MANAGEMENT; SPECTRUM ANALYSIS; THERMODYNAMIC PROPERTIES;

EID: 0034246829     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2000.152     Document Type: Article
Times cited : (361)

References (26)
  • 5
    • 0003696779 scopus 로고
    • edited by G. Haas, M.H. Francombe, and R.W. Hoffman Academic Press, New York
    • J.L. Vossen, in Physics of Thin Films, edited by G. Haas, M.H. Francombe, and R.W. Hoffman (Academic Press, New York, 1977).
    • (1977) Physics of Thin Films
    • Vossen, J.L.1
  • 11
    • 0003952854 scopus 로고
    • edited by W.G. Driscoll and W. Vaughan McGraw-Hill, New York
    • G. Wyszecki, in Handbook of Optics, edited by W.G. Driscoll and W. Vaughan (McGraw-Hill, New York, 1978) p. 9.
    • (1978) Handbook of Optics , pp. 9
    • Wyszecki, G.1
  • 13
    • 0017677758 scopus 로고
    • edited by R.A. Huggins, R.H. Bube, and R.W. Roberts Annual Reviews, Palo Alto, CA
    • G. Haacke, in Annual Review of Materials Science, Vol. 7, edited by R.A. Huggins, R.H. Bube, and R.W. Roberts (Annual Reviews, Palo Alto, CA, 1977) p. 73.
    • (1977) Annual Review of Materials Science , vol.7 , pp. 73
    • Haacke, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.