H2O2-molecular beam epitaxy of high quality ZnO

Applied Physics A: Materials Science and Processing

Volumn 88, Issue 1, 2007, Pages 57-60

  El Shaer, A ^a   Bakin, A ^a   Che Mofor, A ^a   Blasing J ^b   Krost, A ^b   Stoimenos, J ^c   Pecz B ^d   Kreye, M ^a   Waag, A ^a  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^b OTTO VON GUERICKE UNIVERSITY   (Germany)

^c ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^d RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HIGH TEMPERATURE EFFECTS; LATTICE MISMATCH; MOLECULAR BEAM EPITAXY; SCANNING ELECTRON MICROSCOPY; SURFACE MORPHOLOGY;

CRYSTALLINE QUALITY; GROWTH CONDITIONS; VAN DER PAUW CONFIGURATION;

ZINC OXIDE;

EID: 34248512327     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-3959-z     Document Type: Article

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