Experimental evidence of dislocation related shallow states in p-type Si

Physical Review Letters

Volumn 95, Issue 7, 2005, Pages

  Castaldini, A ^a   Cavalcoli, D ^a   Cavallini, A ^a   Pizzini, S ^b  

^a UNIVERSITY OF BOLOGNA   (Italy)

^b UNIVERSITY OF MILANO BICOCCA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTION BAND; JUNCTION SPECTROSCOPY; SHALLOW BANDS; STRAIN FIELDS;

BAND STRUCTURE; CONTAMINATION; DISLOCATIONS (CRYSTALS); MATHEMATICAL MODELS; SEMICONDUCTOR JUNCTIONS; SPECTROSCOPY; STRAIN;

SILICON;

EID: 27144467704     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.076401     Document Type: Article

References (19)

1. L. Pavesi, J. Phys. Condens. Matter 15, R1169 (2003). JCOMEL 0953-8984 10.1088/0953-8984/15/26/201
2. L.T. Canham, Appl. Phys. Lett. 57, 1046 (1990). APPLAB 0003-6951 10.1063/1.103561
3. L. Pavesi, L. Dal Negro, C. Mazzoleni, G. Franzò, and F. Priolo, Nature (London) NATUAS 0028-0836 408, 440 (2000). 10.1038/35044012
4. M.A. Green, J. Zhao, J.A. Wang, P.J. Reece, and M. Gal, Nature (London) NATUAS 0028-0836 412, 805 (2001). 10.1038/35090539
5. W. Schröter and H. Cerva, in Defect Interaction and Clustering, edited by, S. Pizzini, (Trans Tech., Zürich, 2001), 1st ed., p. 67, and literature therein.
6. N. Lehto, Phys. Rev. B PRBMDO 0163-1829 55, 15601 (1997). 10.1103/PhysRevB.55.15601
7. V. Kveder, M. Kittler, and W. Schröter, Phys. Rev. B PRBMDO 0163-1829 63, 115208 (2001). 10.1103/PhysRevB.63.115208
8. V. Kveder, T. Sekiguchi, and K. Sumino, Phys. Rev. B PRBMDO 0163-1829 51, 16721 (1995). 10.1103/PhysRevB.51.16721
9. E. Leoni, S. Binetti, B. Pichaud, and S. Pizzini, Eur. Phys. J. Appl. Phys. EPAPFV 1286-0050 27, 123 (2004).
10. J.A. Davidson and J. Evans, J. Appl. Phys. 81, 251 (1997). JAPIAU 0021-8979 10.1063/1.363991
11. V. Kveder, Yu. Osipyan, W. Schroter, and G. Zoth, Phys. Status Solidi A 72, 701 (1982). PSSABA 0031-8965
12. C. Kisielowski and E.R. Weber, Phys. Rev. B PRBMDO 0163-1829 44, 1600 (1991). 10.1103/PhysRevB.44.1600
13. A. Istratov, H. Hieslmair, and E.R. Weber, Appl. Phys., A 69, APSFDB 0721-7250 13 (1999). 10.1007/s003390050968
14. A. Castaldini, D. Cavalcoli, A. Cavallini, S. Binetti, and S. Pizzini, Appl. Phys. Lett. 86, 162109 (2005). APPLAB 0003-6951 10.1063/1.1881788
15. J. Lagowski, P. Edelman, A.M. Kontkiewicz, O. Milic, W. Heley, M. Dexter, L. Jastrzebski, and A.M. Hoff, Appl. Phys. Lett. 63, 3043 (1993). APPLAB 0003-6951 10.1063/1.110789
16. W. Schroter, J. Kronewitz, U. Gnauert, F. Riedel, and M. Seibt, Phys. Rev. B PRBMDO 0163-1829 52, 13726 (1995). 10.1103/PhysRevB.52.13726
17. V. Higgs, F. Chin, X. Wang, J. Mosalski, and R. Beanland, J. Phys. Condens. Matter 12, 10105 (2000). JCOMEL 0953-8984 10.1088/0953-8984/12/49/310
18. V. Kveder, E. Steinman, S. Shevchenko, and H. Grimmeiss, Phys. Rev. B PRBMDO 0163-1829 51, 10520 (1995). 10.1103/PhysRevB.51.10520
19. F. Riedel and W. Schroeter, Phys. Rev. B PRBMDO 0163-1829 62, 7150 (2000). 10.1103/PhysRevB.62.7150