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Volumn 151, Issue 4, 2004, Pages

Mono- and Multicrystalline Silicon Characterization by Noncontacting Techniques

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CRYSTALLINE MATERIALS; FERMI LEVEL; INTEGRATED CIRCUITS; PARAMETER ESTIMATION; PERMITTIVITY; PHOTOVOLTAIC CELLS; RELIABILITY; SCANNING; SILICON WAFERS; VOLTAGE DISTRIBUTION MEASUREMENT;

EID: 2042505698     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1650838     Document Type: Article
Times cited : (1)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.