Power and reliability management of SoCs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 15, Issue 4, 2007, Pages 391-403

  Rosing, Tajana Simunic ^a,b   Mihic, Kresimir ^a,c   De Micheli, Giovanni ^a,b  

^a IEEE   (United States)

^b EPFL   (Switzerland)

^c STANFORD UNIVERSITY   (United States)

Author keywords

Optimal control; Power consumption; Reliability management

Indexed keywords

OPTIMAL CONTROL; OPTIMIZATION PROBLEM; RELIABILITY MANAGEMENT; VOLTAGE MARGINS;

ELECTRIC POWER SYSTEM INTERCONNECTION; ELECTRIC POWER UTILIZATION; OPTIMAL CONTROL SYSTEMS; OPTIMIZATION; RELIABILITY; TRANSISTORS;

MICROPROCESSOR CHIPS;

EID: 34247581920     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2007.895245     Document Type: Article

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