-
2
-
-
84861264934
-
Compaq NonStop Himalaya S-series server description manual
-
Compaq NonStop Himalaya S-Series Server Description Manual. In Compaq Technical Manual 520331-001, http://www.compaq.com.
-
Compaq Technical Manual 520331-001
-
-
-
3
-
-
84862086948
-
Methods for calculating failure rates in units of FITs
-
Methods for Calculating Failure Rates in Units of FITs. In JEDEC Publication JESD85, 2001.
-
(2001)
JEDEC Publication JESD85
-
-
-
5
-
-
0034316092
-
Power-aware microarchitecture: Design and modeling challenges for the next-generation microprocessor
-
D. Brooks et al. Power-aware Microarchitecture: Design and Modeling Challenges for the next-generation microprocessor. In IEEE Micro, 2000.
-
(2000)
IEEE Micro
-
-
Brooks, D.1
-
6
-
-
0033719421
-
Wattch: A framework for architectural-level power analysis and optimizations
-
D. Brooks et al. Wattch: A Framework for Architectural-Level Power Analysis and Optimizations. In Proc. of the 27th Annual Intl. Symp. on Comp. Arch., 2000.
-
(2000)
Proc. of the 27th Annual Intl. Symp. on Comp. Arch.
-
-
Brooks, D.1
-
8
-
-
1542269347
-
Reducing power density through activity migration
-
S. Heo et al. Reducing Power Density Through Activity Migration. In Intl. Symp. on Low Power Elec. Design, 2003.
-
(2003)
Intl. Symp. on Low Power Elec. Design
-
-
Heo, S.1
-
11
-
-
0032164444
-
Defect tolerant VLSI circuits: Techniques and yield analysis
-
I. Koren et al. Defect Tolerant VLSI Circuits: Techniques and Yield Analysis. In Proceedings of the IEEE, 1998.
-
(1998)
Proceedings of the IEEE
-
-
Koren, I.1
-
12
-
-
0032683935
-
Environment for PowerPC microarchitectural exploration
-
M. Moudgill et al. Environment for PowerPC microarchitectural exploration. In IEEE Micro, 1999.
-
(1999)
IEEE Micro
-
-
Moudgill, M.1
-
13
-
-
84994353124
-
Validation of turandot, a fast processor model for microarchitectural exploration
-
M. Moudgill et al. Validation of turandot, a fast processor model for microarchitectural exploration. In IEEE Intl Perf., Computing, and Communications Conf., 1999.
-
(1999)
IEEE Intl Perf., Computing, and Communications Conf.
-
-
Moudgill, M.1
-
15
-
-
0345412735
-
Exploiting microarchitectural redundancy for defect tolerance
-
P. Shivakumar et al. Exploiting Microarchitectural Redundancy for Defect Tolerance. In 21st Intl. Conf. on Comp. Design, 2003.
-
(2003)
21st Intl. Conf. on Comp. Design
-
-
Shivakumar, P.1
-
17
-
-
0033314330
-
IBM S/390 parallel enterprise server G5 fault tolerance: A historical perspective
-
September/November
-
L. Spainhower et al. IBM S/390 Parallel Enterprise Server G5 Fault Tolerance: A Historical Perspective. In IBM Journal of R&D, September/November 1999.
-
(1999)
IBM Journal of R&D
-
-
Spainhower, L.1
-
22
-
-
4544257707
-
A Model for Negative Bias Temperature Instability (NBTI) in oxide and high-K pFETs
-
June
-
S. Zafar et al. A Model for Negative Bias Temperature Instability (NBTI) in Oxide and High-K pFETs. In 2004 Symposia on VLSI Technology and Circuits, June, 2004.
-
(2004)
2004 Symposia on VLSI Technology and Circuits
-
-
Zafar, S.1
|