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Volumn , Issue , 2005, Pages 520-531

Exploiting structural duplication for lifetime reliability enhancement

Author keywords

[No Author keywords available]

Indexed keywords

GRACEFUL PERFORMANCE DEGRADATION (GPD); PROCESSOR RELIABILITY; STRUCTURAL DUPLICATION; STRUCTURAL REDUNDANCY;

EID: 27544457181     PISSN: 10636897     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCA.2005.28     Document Type: Conference Paper
Times cited : (163)

References (22)
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    • Compaq NonStop Himalaya S-Series Server Description Manual. In Compaq Technical Manual 520331-001, http://www.compaq.com.
    • Compaq Technical Manual 520331-001
  • 3
    • 84862086948 scopus 로고    scopus 로고
    • Methods for calculating failure rates in units of FITs
    • Methods for Calculating Failure Rates in Units of FITs. In JEDEC Publication JESD85, 2001.
    • (2001) JEDEC Publication JESD85
  • 5
    • 0034316092 scopus 로고    scopus 로고
    • Power-aware microarchitecture: Design and modeling challenges for the next-generation microprocessor
    • D. Brooks et al. Power-aware Microarchitecture: Design and Modeling Challenges for the next-generation microprocessor. In IEEE Micro, 2000.
    • (2000) IEEE Micro
    • Brooks, D.1
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    • 0033719421 scopus 로고    scopus 로고
    • Wattch: A framework for architectural-level power analysis and optimizations
    • D. Brooks et al. Wattch: A Framework for Architectural-Level Power Analysis and Optimizations. In Proc. of the 27th Annual Intl. Symp. on Comp. Arch., 2000.
    • (2000) Proc. of the 27th Annual Intl. Symp. on Comp. Arch.
    • Brooks, D.1
  • 8
    • 1542269347 scopus 로고    scopus 로고
    • Reducing power density through activity migration
    • S. Heo et al. Reducing Power Density Through Activity Migration. In Intl. Symp. on Low Power Elec. Design, 2003.
    • (2003) Intl. Symp. on Low Power Elec. Design
    • Heo, S.1
  • 11
    • 0032164444 scopus 로고    scopus 로고
    • Defect tolerant VLSI circuits: Techniques and yield analysis
    • I. Koren et al. Defect Tolerant VLSI Circuits: Techniques and Yield Analysis. In Proceedings of the IEEE, 1998.
    • (1998) Proceedings of the IEEE
    • Koren, I.1
  • 12
    • 0032683935 scopus 로고    scopus 로고
    • Environment for PowerPC microarchitectural exploration
    • M. Moudgill et al. Environment for PowerPC microarchitectural exploration. In IEEE Micro, 1999.
    • (1999) IEEE Micro
    • Moudgill, M.1
  • 13
    • 84994353124 scopus 로고    scopus 로고
    • Validation of turandot, a fast processor model for microarchitectural exploration
    • M. Moudgill et al. Validation of turandot, a fast processor model for microarchitectural exploration. In IEEE Intl Perf., Computing, and Communications Conf., 1999.
    • (1999) IEEE Intl Perf., Computing, and Communications Conf.
    • Moudgill, M.1
  • 15
    • 0345412735 scopus 로고    scopus 로고
    • Exploiting microarchitectural redundancy for defect tolerance
    • P. Shivakumar et al. Exploiting Microarchitectural Redundancy for Defect Tolerance. In 21st Intl. Conf. on Comp. Design, 2003.
    • (2003) 21st Intl. Conf. on Comp. Design
    • Shivakumar, P.1
  • 17
    • 0033314330 scopus 로고    scopus 로고
    • IBM S/390 parallel enterprise server G5 fault tolerance: A historical perspective
    • September/November
    • L. Spainhower et al. IBM S/390 Parallel Enterprise Server G5 Fault Tolerance: A Historical Perspective. In IBM Journal of R&D, September/November 1999.
    • (1999) IBM Journal of R&D
    • Spainhower, L.1
  • 22
    • 4544257707 scopus 로고    scopus 로고
    • A Model for Negative Bias Temperature Instability (NBTI) in oxide and high-K pFETs
    • June
    • S. Zafar et al. A Model for Negative Bias Temperature Instability (NBTI) in Oxide and High-K pFETs. In 2004 Symposia on VLSI Technology and Circuits, June, 2004.
    • (2004) 2004 Symposia on VLSI Technology and Circuits
    • Zafar, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.