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Volumn , Issue , 2002, Pages
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Trading off reliability and power-consumption in ultra-low power systems
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC POWER UTILIZATION;
LOW POWER ELECTRONICS;
SPICE;
BATTERY LIFE;
CIRCUIT LEVELS;
CLASSIFIEDS;
CRITICAL SYSTEMS;
ELECTRONIC GADGETS;
FAULT TOLERANCE TECHNIQUES;
LOGIC LEVELS;
SPATIAL REDUNDANCY;
ULTRA-LOW POWER CONSUMPTION;
ULTRA-LOW POWER SYSTEMS;
FAULT TOLERANCE;
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EID: 85115873328
PISSN: 19483287
EISSN: 19483295
Source Type: Conference Proceeding
DOI: 10.1109/ISQED.2002.996773 Document Type: Conference Paper |
Times cited : (4)
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References (12)
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