Trading off reliability and power-consumption in ultra-low power systems

Proceedings - International Symposium on Quality Electronic Design, ISQED

Volumn , Issue , 2002, Pages

  Maheshwari, Atul ^a   Burleson, Wayne ^a   Tessier, Russell ^a  

^a University of Massachusetts Amherst   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER UTILIZATION; LOW POWER ELECTRONICS; SPICE;

BATTERY LIFE; CIRCUIT LEVELS; CLASSIFIEDS; CRITICAL SYSTEMS; ELECTRONIC GADGETS; FAULT TOLERANCE TECHNIQUES; LOGIC LEVELS; SPATIAL REDUNDANCY; ULTRA-LOW POWER CONSUMPTION; ULTRA-LOW POWER SYSTEMS;

FAULT TOLERANCE;

EID: 85115873328     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2002.996773     Document Type: Conference Paper

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