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Volumn 49, Issue 4, 2007, Pages 646-650

Charge accumulation layer in Cs,Ba/n-GaN(0001) ultrathin interfaces: Electronic and photoemission properties

Author keywords

[No Author keywords available]

Indexed keywords


EID: 34247465072     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1063783407040075     Document Type: Article
Times cited : (3)

References (25)
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    • F. Machuca, Y. Sun, Z. Liu, P. Pianetta, W. E. Spicer, and R. F. W. Pease, J. Vac. Sci. Technol., B: Microelectron, Nanometer Struct. - Process., Meas., Phenom. 20, 2721 (2002).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.