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Volumn 61, Issue 16, 2000, Pages 10966-10971

Interfacial reaction and Fermi level movement induced by sequentially deposited metals on GaN: Au/Ni/GaN

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EID: 0005850444     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.10966     Document Type: Article
Times cited : (30)

References (31)
  • 5
    • 0000537361 scopus 로고    scopus 로고
    • J.-S. Jang, I.-S. Chang, H.-K. Kim, T.-Y. Seong, S.-H. Lee, and S.-J. Park, Appl. Phys. Lett. 74, 70 (1999).
    • (1999) Appl. Phys. Lett. , vol.74 , pp. 70
  • 29
    • 85037874059 scopus 로고    scopus 로고
    • J. Neugebauer and Chris G. Van de Walle in Gallium Nitride and Related Materials, edited by F.A. Ponce, R.D. Dupis, S. Nakamura, and J.A. Edmond, MRS Symposia Proceedings No. 395 (Materials Research Society, Pittsburgh, 1996), p. 645.
    • (1996) MRS Symposia Proceedings , pp. 645
    • Neugebauer, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.